The Microscopy and Microanalysis Laboratory – SEM/CL Section is equipped with two scanning electron microscopes (SEM), JEOL 6010 and JEOL 6510. These instruments provide imaging using backscattered electrons (BSE), secondary electrons (SE), and cathodoluminescence (CL). They also allow standardless semi-quantitative/quantitative (for major elements) microchemical analyses through Oxford X-Max 20 energy dispersive x-ray detector (EDS-energy-dispersive X-ray spectroscopy), based on a ratio of peak intensities, converting the relative abundance of elements using the Aztec software package (Oxford). All analyses are conducted on polished thin sections, polished sections, and polished slabs of rocks, minerals, soils, fossils, ores, and related materials.
